News

Semiconductor Engineering5h
Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: ...
Semiconductor Engineering5h
Transformation Of 2D-ICs Into 3D-ICs Using Shuttle Chips From Multi-Project Wafers (Tohoku University)
Level Transformation of 2D Shuttle Chips into 3D-IC for Advanced Rapid Prototyping using Meta Bonding” was published by ...
Semiconductor Engineering11h
Air-Gap Covert Channel Attack On Spread Spectrum Modulated Clocks (IETR, Lab-STICC)
Clock Modulation Covert Channel” was published by researchers at University of Rennes-INSA Rennes-IETR-UMR  and Université ...
Semiconductor Engineering21h
Research Bits: May 20
Along with showing excellent electrical conductivity, the printed fabrics continued to perform well after 20 cycles of ...
Semiconductor Engineering11h
Energy-Aware DL: The Interplay Between NN Efficiency And Hardware Constraints (Imperial College London, Cambridge)
Aware Deep Learning on Resource-Constrained Hardware” was published by researchers at Imperial College London and University of Cambridge. Abstract “The use of deep learning (DL) on Internet of Things ...
Semiconductor Engineering11h
Open-Source And Royalty-Free Confidential Computing For Embedded RISC-V Systems (IBM, Max Planck)
Confidential Computing for Embedded RISC-V Systems” was published by researchers at IBM Research, IBM T.J. Watson Research Center, Max Planck Institute for Software Systems (MPI-SWS). Abstract ...
Semiconductor Engineering20h
Problems In Testing AI Chips
As AI chips get larger, it becomes much harder to test them. Today, there can be as many as 22,000 pins on a 150mm² die, but in the future that number may increase to 80,000 pins. That creates a huge ...